After the manufacturing process for the semiconductor or battery is completed, the presence or absence of a good product for the product is inspected.
In the case of semiconductors, it is possible to check if they operate normally under certain harsh conditions, and in the case of batteries, it is possible to check if they have explosive properties under certain harsh conditions.
An electronic component to be inspected is provided on a test bed provided in a chamber inner box, and air in the chamber is heated or cooled through a heater or a cooler. At this time, the air is adjusted to a temperature consistent with the harsh conditions configured, which allows the test bed to be placed under harsh conditions, creating a chamber that can test electronic components under these harsh conditions.