Solide State Drive Test Chamber
The SSD Chamber uses semiconductors to store information and inspect SSD performance and reliability by installing SOLID STATE DRIVE, a next-generation memory storage device with low mechanical delay, failure rate, and exothermic noise, in the chamber and maintaining or controlling the temperature between -20'C and 125'C
Monitoring Burn-in Test Chamber
The MBT Chamber is a device that evaluates the reliability of multiple semiconductor devices and can maintain or control the temperature of -40'C to 150'C for early failure evaluation to create a large-capacity inspection environment
Create a test chamber for post-semiconductor process
We also provide Reliability Testing Services to test your electronic devices or components for product reliability through burn-in testing, accelerated life testing, and environment chamber testing
