Solide State Drive Test Chamber

SSD Chamber

The SSD Chamber uses semiconductors to store information and inspect SSD performance and reliability by installing SOLID STATE DRIVE, a next-generation memory storage device with low mechanical delay, failure rate, and exothermic noise, in the chamber and maintaining or controlling the temperature between -20'C and 125'C

Monitoring Burn-in Test Chamber

MBT Chamber

The MBT Chamber is a device that evaluates the reliability of multiple semiconductor devices and can maintain or control the temperature of -40'C to 150'C for early failure evaluation to create a large-capacity inspection environment

Create a test chamber for post-semiconductor process


We also provide Reliability Testing Services to test your electronic devices or components for product reliability through burn-in testing, accelerated life testing, and environment chamber testing

Custom Automatic Test Chamber